X-Ray Photoelectron Spectroscopy
Scienta Omicron Environmental XPS with glove box for air-sensitive sample preparation
|
Analysis chamber of Near-Ambient Pressure XPS
|
Photoelectron analyzer on E-XPS
|
Electron Microscopy
FEI Talos F200X S/TEM
|
In-situ Microscopy
|
FEI Helios FIB/SEM
|
Microtomy
Ultramicrotome
|
Diamond Knife for Ultramicrotomy
|
Trimming Tool
|
Tomography
Cameca LEAP 4000X Si Atom Probe Tomography
|
Custom-made, In-Operando, micro-CT cell
|
Experience at synchrotrons for various characterization techniques
|
